Grain size and strain in thin sputter-deposited Ni0.8Fe0.2 and Cu films
D.G. Neerinck, A.E.M. De Veirman, M.H.J. Slangen, Th.G.S.M. Rijks, J.C.S. KoolsVolume:
280
Year:
1996
Language:
english
Pages:
6
DOI:
10.1016/0040-6090(95)08244-1
File:
PDF, 2.27 MB
english, 1996