Modular dynamic pulse stress test system for discrete high power semiconductors
Patmanidis, K., Glavanovics, M., Georgakas, A., Muetze, A.Volume:
114
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2020.113852
Date:
November, 2020
File:
PDF, 5.86 MB
2020