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Design of a Small NEMP Simulator for the Immunity Test of Core Electronic Components in HEMP Environments
Kim, Young-Jin, Jeong, Young-Kyung, Youn, Dong-Gi, Park, Hyun Ho, Park, Yong BaeVolume:
8
Year:
2020
Journal:
IEEE Access
DOI:
10.1109/ACCESS.2020.3042262
File:
PDF, 6.24 MB
2020