[IEEE 2020 International Conference on Computer Vision,...

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[IEEE 2020 International Conference on Computer Vision, Image and Deep Learning (CVIDL) - Chongqing, China (2020.7.10-2020.7.12)] 2020 International Conference on Computer Vision, Image and Deep Learning (CVIDL) - A Mask Detection Method for Shoppers Under the Threat of COVID-19 Coronavirus

Han, Wenxuan, Huang, Zitong, kuerban, Alifu., Yan, Meng, Fu, Haitang
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Year:
2020
DOI:
10.1109/CVIDL51233.2020.00-54
File:
PDF, 388 KB
2020
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