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[IEEE 2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Singapore, Singapore (2020.7.20-2020.7.23)] 2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Degradation Mechanism of Short Channel p- FinFETs under Hot Carrier Stress and Constant Voltage Stress
Chang, Hao, Zhou, Longda, Yang, Hong, Ji, Zhigang, Liu, Qianqian, Xu, Hao, Simoen, Eddy, Yin, Huaxiang, Wang, WenwuYear:
2020
DOI:
10.1109/IPFA49335.2020.9260834
File:
PDF, 617 KB
2020