THz Characterization and Modeling of SiGe HBTs: Review (Invited)
Fregonese, Sebastien, Deng, Marina, Cabbia, Marco, Yadav, Chandan, De Matos, Magali, Zimmer, ThomasVolume:
8
Year:
2020
Journal:
IEEE Journal of the Electron Devices Society
DOI:
10.1109/JEDS.2020.3036135
File:
PDF, 3.18 MB
2020