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Phase Perturbation as a Measurement Metric: A Novel Noncontact In-Line Production Measurement Through an All-Electronic Millimeter-Wave System Tracking Millidegree Perturbations in Phase
Day, Aaron M., Dwyer, Matthew M., van der Weide, Daniel W.Volume:
22
Journal:
IEEE Microwave Magazine
DOI:
10.1109/MMM.2020.3023270
Date:
January, 2021
File:
PDF, 1.77 MB
2021