Experimental Observation and Modeling of the Impact of...

IEEE Transactions on Electron Devices 2020 / 12 Vol. 67; Iss. 12

Experimental Observation and Modeling of the Impact of Traps on Static and Analog/HF Performance of Graphene Transistors

Pacheco-Sanchez, Anibal, Mavredakis, Nikolaos, Feijoo, Pedro C., Wei, Wei, Pallecchi, Emiliano, Happy, Henri, Jimenez, David
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Volume:
67
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2020.3029542
Date:
December, 2020
File:
PDF, 1.01 MB
2020
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