Electrical and Data-Retention Characteristics of...

IEEE Open Journal of Nanotechnology 2020 Vol. 1

Electrical and Data-Retention Characteristics of Two-Terminal Thyristor Random Access Memory

Kim, Hyangwoo, Cho, Hyeonsu, Kong, Byoung Don, Kim, Jin-Woo, Meyyappan, Meyya, Baek, Chang-Ki
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Volume:
1
Year:
2020
Journal:
IEEE Open Journal of Nanotechnology
DOI:
10.1109/ojnano.2020.3042804
File:
PDF, 1.12 MB
2020
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