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IEEE Transactions on Reliability 2020

Have it Your Way: Generating Customized Log Datasets With a Model-Driven Simulation Testbed

Landauer, Max, Skopik, Florian, Wurzenberger, Markus, Hotwagner, Wolfgang, Rauber, Andreas
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Year:
2020
Journal:
IEEE Transactions on Reliability
DOI:
10.1109/tr.2020.3031317
File:
PDF, 2.67 MB
2020
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