Simulation of thin film growth and in situ characterization...

Vacuum 1995 Vol. 46; Iss. 8-10

Simulation of thin film growth and in situ characterization by RHEED and photoemission

M Djafari Rouhani, N Fazouan, AM Gue, D Estève
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Volume:
46
Year:
1995
Language:
english
Pages:
4
DOI:
10.1016/0042-207x(95)00075-5
File:
PDF, 407 KB
english, 1995
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