Growth and characterization of yttrium oxide thin layers on...

Growth and characterization of yttrium oxide thin layers on silicon deposited by yttrium evaporation in atomic oxygen

Jan Hudner, Håkan Ohlsén, Eva Fredriksson
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Volume:
46
Year:
1995
Language:
english
Pages:
4
DOI:
10.1016/0042-207x(95)00084-4
File:
PDF, 556 KB
english, 1995
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