Spatially resolved microanalysis of thin films in the...

Vacuum 1995 Vol. 46; Iss. 8-10

Spatially resolved microanalysis of thin films in the transmission electron microscope

M Schenner, P Schattschneider, DS Su, E Zeitler
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Volume:
46
Year:
1995
Language:
english
Pages:
2
DOI:
10.1016/0042-207x(95)00101-8
File:
PDF, 145 KB
english, 1995
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