Assessing multi-output Gaussian process regression for...

Microelectronics Reliability 2020 / 11 Vol. 114

Assessing multi-output Gaussian process regression for modeling of non-monotonic degradation trends of light emitting diodes in storage

Lim, S.L.H., Duong, P.L.T., Park, H., Singh, P., Tan, C.M., Raghavan, N.
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Volume:
114
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2020.113794
Date:
November, 2020
File:
PDF, 881 KB
2020
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