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Correlative microscopy workflow for precise targeted failure analysis of multi-layer ceramic capacitors
May, Nicholas, Favata, Joseph, Ahmadi, Bahar, Tavousi, Pouya, Shahbazmohamadi, SinaVolume:
114
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2020.113858
Date:
November, 2020
File:
PDF, 2.30 MB
2020