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[IEEE 2020 Third International Conference on Artificial Intelligence for Industries (AI4I) - Irvine, CA, USA (2020.9.21-2020.9.23)] 2020 Third International Conference on Artificial Intelligence for Industries (AI4I) - Exploring Faster RCNN for Fabric Defect Detection
Zhou, Hao, Jang, Byunghyun, Chen, Yixin, Troendle, DavidYear:
2020
DOI:
10.1109/AI4I49448.2020.00018
File:
PDF, 1.35 MB
2020