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[IEEE 2020 International Semiconductor Conference (CAS) - Sinaia, Romania (2020.10.7-2020.10.9)] 2020 International Semiconductor Conference (CAS) - Effect of interface trap distribution on SiC-based power MOS device and circuit characteristics
Nayak, Suvendu, Lodha, Saurabh, Ganguly, SwaroopYear:
2020
DOI:
10.1109/CAS50358.2020.9268005
File:
PDF, 1.53 MB
2020