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[IEEE 2020 IEEE International Ultrasonics Symposium (IUS) - Las Vegas, NV, USA (2020.9.7-2020.9.11)] 2020 IEEE International Ultrasonics Symposium (IUS) - Adaptive Slow-time Singular Value Thresholding (SVT) based on Stein's Unbiased Risk Estimate (SURE) for Ultrasound Image Random Noise Reduction
Apostolakis, Iason Zacharias, Shin, Jun Seob, Meral, Can, Robert, Jean-Luc, Sadeghi, Ali, Vignon, FrancoisYear:
2020
DOI:
10.1109/IUS46767.2020.9251578
File:
PDF, 884 KB
2020