Various Reliability Investigations of Low Temperature...

Various Reliability Investigations of Low Temperature Polycrystalline Silicon Tunnel Field-Effect Thin-Film Transistor

Ma, William Cheng-Yu, Hsu, Hui-Shun, Wang, Hsiao-Chun
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
20
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/TDMR.2020.3035336
Date:
December, 2020
File:
PDF, 1.41 MB
2020
Conversion to is in progress
Conversion to is failed