Various Reliability Investigations of Low Temperature Polycrystalline Silicon Tunnel Field-Effect Thin-Film Transistor
Ma, William Cheng-Yu, Hsu, Hui-Shun, Wang, Hsiao-ChunVolume:
20
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/TDMR.2020.3035336
Date:
December, 2020
File:
PDF, 1.41 MB
2020