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[IEEE 2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Singapore, Singapore (2020.7.20-2020.7.23)] 2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Efficient Fault and Defect Localization Through Multiple Emission Site Analysis
Lacaba, Arriane P., Arazas, Andrea Pauline, Awitan, Fritz Christian B., Benedict, Lawrence A.Year:
2020
DOI:
10.1109/ipfa49335.2020.9260597
File:
PDF, 971 KB
2020