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[IEEE 2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Singapore, Singapore (2020.7.20-2020.7.23)] 2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Optimization on On-Chip Surge Protection Device for USB Type-C HV Pins
Chen, Ming-Chun, Ker, Ming-Dou, Jou, Yeh-Ning, Lee, Jian-HsingYear:
2020
DOI:
10.1109/ipfa49335.2020.9261023
File:
PDF, 1.56 MB
2020