A reliability evaluation method for multi-performance...

Microelectronics Reliability 2020 / 11 Vol. 114

A reliability evaluation method for multi-performance degradation products based on the Wiener process and Copula function

Pan, Guangze, Li, Yaqiu, Li, Xiaobing, Luo, Qin, Wang, Chunhui, Hu, Xianghong
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Volume:
114
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2020.113758
Date:
November, 2020
File:
PDF, 932 KB
2020
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