[IEEE 2020 International Semiconductor Conference (CAS) - Sinaia, Romania (2020.10.7-2020.10.9)] 2020 International Semiconductor Conference (CAS) - AFM studies on surface morphology evolution after annealing of V 2 O 5 thin films grown by spray pyrolysis
Pachiu, C., Carp, M., Mouratis, K., Tudose, I.V., Romanitan, C., Tutunaru, O., Couris, S., Koudoumas, E., Suchea, M.P.Year:
2020
DOI:
10.1109/CAS50358.2020.9267972
File:
PDF, 1.39 MB
2020