[IEEE 2020 IEEE Symposium on VLSI Technology - Honolulu, HI, USA (2020.6.16-2020.6.19)] 2020 IEEE Symposium on VLSI Technology - A Reliable TDDB Lifetime Projection Model Verified Using 40Mb STT-MRAM Macro at Sub-ppm Failure Rate To Realize Unlimited Endurance for Cache Applications
Naik, V. B., Yamane, K., Lim, J. H., Lee, T. Y., Kwon, J., Aein, Behin, Chung, N. L., Hau, L. Y., Chao, R., Zeng, D., Otani, Y., Chiang, C, Huang, Y., Pu, L., Thiyagarajah, N., Jang, S. H., Neo, W. P.Year:
2020
DOI:
10.1109/VLSITechnology18217.2020.9265086
File:
PDF, 811 KB
2020