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[IEEE IECON 2020 - 46th Annual Conference of the IEEE Industrial Electronics Society - Singapore, Singapore (2020.10.18-2020.10.21)] IECON 2020 The 46th Annual Conference of the IEEE Industrial Electronics Society - Examining convolutional feature extraction using Maximum Entropy (ME) and Signal-to-Noise Ratio (SNR) for image classification
Gowdra, Nidhi, Sinha, Roopak, MacDonell, StephenYear:
2020
DOI:
10.1109/IECON43393.2020.9254346
File:
PDF, 217 KB
2020