[IEEE 2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Singapore, Singapore (2020.7.20-2020.7.23)] 2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Transient Voltage Suppressor (TVS) on Signal Integrity of Microelectronics System with CMOS ICs under System-Level ESD Test
Shen, Yu-Shu, Ker, Ming-Dou, Jiang, Hsin-ChinYear:
2020
DOI:
10.1109/ipfa49335.2020.9261022
File:
PDF, 1.82 MB
2020