Reliable Technology Evaluation of SiGe HBTs and MOSFETs:...

IEEE Electron Device Letters 2021 / 1 Vol. 42; Iss. 1

Reliable Technology Evaluation of SiGe HBTs and MOSFETs: f MAX Estimation From Measured Data

Saha, Bishwadeep, Fregonese, Sebastien, Heinemann, Bernd, Scheer, Patrick, Chevalier, Pascal, Aufinger, Klaus, Chakravorty, Anjan, Zimmer, Thomas
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Volume:
42
Journal:
IEEE Electron Device Letters
DOI:
10.1109/LED.2020.3040891
Date:
January, 2021
File:
PDF, 1.19 MB
2021
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