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[IEEE 2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Singapore, Singapore (2020.7.20-2020.7.23)] 2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Utilization of ELITE System for Precise Fault Localization of Metal Defect Functional Failure
Apolinaria, Ronald C.Year:
2020
DOI:
10.1109/ipfa49335.2020.9260612
File:
PDF, 1.93 MB
2020