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Test generation by activation and defect-drive (TEGAD)
Susumu Nitta, Masahiko Kawamura, Kanji HirabayashiVolume:
3
Year:
1985
Language:
english
Pages:
10
DOI:
10.1016/0167-9260(85)90051-3
File:
PDF, 1.41 MB
english, 1985