On the SIMS depth profiling analysis: reduction of matrix...

International Journal of Mass Spectrometry and Ion Processes 1995 Vol. 143; Iss. none

On the SIMS depth profiling analysis: reduction of matrix effect

Y. Gao, Y. Marie, F. Saldi, H.-N. Migeon
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Volume:
143
Year:
1995
Language:
english
Pages:
8
DOI:
10.1016/0168-1176(94)04113-l
File:
PDF, 725 KB
english, 1995
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