Detection of charged particles in amorphous silicon layers

Detection of charged particles in amorphous silicon layers

V. Perez-Mendez, J. Morel, S.N. Kaplan, R.A. Street
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Volume:
252
Year:
1986
Language:
english
Pages:
5
DOI:
10.1016/0168-9002(86)91227-1
File:
PDF, 380 KB
english, 1986
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