Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
1996 Vol. 377; Iss. 2-3
![](/img/cover-not-exists.png)
Investigation on the Neff reverse annealing effect using TSC/I-DLTS: Relationship between neutron induced microscopic defects and silicon detector electrical degradations
Z. Li, C.J. Li, V. Eremin, E. VerbitskayaVolume:
377
Year:
1996
Language:
english
Pages:
11
DOI:
10.1016/0168-9002(95)01410-1
File:
PDF, 788 KB
english, 1996