Pion-induced damage in silicon detectors

Pion-induced damage in silicon detectors

S.J. Bates, C. Furetta, M. Glaser, F. Lemeilleur, E. León-Florián, C. Gößling, B. Kaiser, A. Rolf, R. Wunstorf, H. Feick, E. Fretwurst, G. Lindström, M. Moll, G. Taylor, A. Chilingarov
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Volume:
379
Year:
1996
Language:
english
Pages:
8
DOI:
10.1016/0168-9002(96)00538-4
File:
PDF, 881 KB
english, 1996
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