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Estimating the barrier layer thickness of porous aluminium oxide films with A.C. impedance measurements
F. Debuyck, L. Lemaitre, M. Moors, A.P. Van Peteghem, E. Wettinck, L. WeytenVolume:
34
Year:
1988
Language:
english
Pages:
8
DOI:
10.1016/0257-8972(88)90121-1
File:
PDF, 331 KB
english, 1988