Real time monitoring of filament-assisted chemically vapor deposited diamond by spectroscopic ellipsometry
Yue Cong, Ilsin An, H.V. Nguyen, K. Vedam, R. Messier, R.W. CollinsVolume:
49
Year:
1991
Language:
english
Pages:
6
DOI:
10.1016/0257-8972(91)90087-d
File:
PDF, 705 KB
english, 1991