On the use of x-ray-excited optical luminescence (XEOL) for...

Chemical Physics 1983 Vol. 78; Iss. 3

On the use of x-ray-excited optical luminescence (XEOL) for the analysis of multisite rare-earth systems

Pascal Tola, Alain Retournard, Jeannette Dexpert-Ghys, Marc Lemonnier, Maurice Pagel, José Goulon
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Volume:
78
Year:
1983
Language:
english
Pages:
7
DOI:
10.1016/0301-0104(83)85120-9
File:
PDF, 515 KB
english, 1983
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