Examination of the pathways in the soft X-ray (530.8 eV) induced fragmentation of O2 by electron-ion coincidence measurements
D.M. Hanson, D.A. Lapiano-Smith, K. Lee, C.I. Ma, D.Y. KimVolume:
162
Year:
1992
Language:
english
Pages:
9
DOI:
10.1016/0301-0104(92)85021-l
File:
PDF, 778 KB
english, 1992