Cross-sectional TEM investigations of the microstructure...

Cross-sectional TEM investigations of the microstructure and film-substrate substrate interface in Y-Ba-Cu-O thin films

M.J. Casanove, A. Alimoussa, C. Roucau, C. Escribe-Filippini, P.L. Reydet, P. Marcus
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Volume:
175
Year:
1991
Language:
english
Pages:
8
DOI:
10.1016/0921-4534(91)90599-t
File:
PDF, 1.07 MB
english, 1991
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