Scanning Kelvin probe as a high resolution surface analysis device
H.D. Liess, R. Mäckel, H. Baumgärtner, J. RenVolume:
14
Year:
1993
Language:
english
Pages:
2
DOI:
10.1016/0925-4005(93)85165-7
File:
PDF, 105 KB
english, 1993