Ultrafast electronic raman spectroscopy in semiconductors

Progress in Crystal Growth and Characterization of Materials 1996 Vol. 33; Iss. 1-3

Ultrafast electronic raman spectroscopy in semiconductors

Tohru Suemoto, Koichiro Tanaka, Hideyuki Ohtake
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Volume:
33
Year:
1996
Language:
english
Pages:
7
DOI:
10.1016/0960-8974(96)83613-8
File:
PDF, 401 KB
english, 1996
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