Optical models for the ellipsometric characterization of...

Optical models for the ellipsometric characterization of carbon nitride layers prepared by inverse pulsed laser deposition

P. Petrik, T. Lohner, L. Égerházi, Zs. Geretovszky
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Volume:
253
Year:
2006
Language:
english
Pages:
4
DOI:
10.1016/j.apsusc.2006.05.102
File:
PDF, 219 KB
english, 2006
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