XPS characterization of sensitized n-TiO2 thin films for...

Applied Surface Science 2008 Vol. 254; Iss. 6

XPS characterization of sensitized n-TiO2 thin films for dye-sensitized solar cell applications

Antonio Otávio T. Patrocínio, Eucler B. Paniago, Roberto M. Paniago, Neyde Y. Murakami Iha
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Volume:
254
Year:
2008
Language:
english
Pages:
6
DOI:
10.1016/j.apsusc.2007.07.185
File:
PDF, 440 KB
english, 2008
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