SIMS characterization of segregation in InAs/GaAs...

Applied Surface Science 2008 Vol. 255; Iss. 4

SIMS characterization of segregation in InAs/GaAs heterostructures

S. Gallardo, Y. Kudriatsev, A. Villegas, G. Ramírez, R. Asomoza, E. Cruz-Hernández, J.S. Rojas-Ramirez, M. López-López
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Volume:
255
Year:
2008
Language:
english
Pages:
4
DOI:
10.1016/j.apsusc.2008.05.174
File:
PDF, 287 KB
english, 2008
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