Gravimetrical and chemical characterization of SiOx...

Gravimetrical and chemical characterization of SiOx structures deposited on fine powders by short plasma exposure in a plasma down stream reactor

Adrian Spillmann, Axel Sonnenfeld, Philipp Rudolf von Rohr
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Volume:
255
Year:
2008
Language:
english
Pages:
5
DOI:
10.1016/j.apsusc.2008.06.121
File:
PDF, 361 KB
english, 2008
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