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Analysis of ITO/Mg:GaN interfaces by synchrotron radiation hard X-ray photoemission spectroscopy and their electrical characteristics
Y. Toyoshima, K. Horiba, M. Oshima, J. Ohta, H. Fujioka, H. Miki, S. Ueda, Y. Yamashita, H. Yoshikawa, K. KobayashiVolume:
255
Year:
2008
Language:
english
Pages:
4
DOI:
10.1016/j.apsusc.2008.07.050
File:
PDF, 527 KB
english, 2008