Behaviour of total surface charge in SiO2–Si system under...

Applied Surface Science 2009 Vol. 255; Iss. 13-14

Behaviour of total surface charge in SiO2–Si system under short-pulsed ultraviolet irradiation cycles characterised by surface photo voltage technique

Ban-Hong Kang, Wah-Pheng Lee, Ho-Kwang Yow, Teck-Yong Tou
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Volume:
255
Year:
2009
Language:
english
Pages:
6
DOI:
10.1016/j.apsusc.2009.02.056
File:
PDF, 401 KB
english, 2009
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