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Simultaneous measurement on particles in solution with size ranging from nm to sub-mm by microscope light scattering spectroscopy and image analyzing system
Yao-Xiong HuangVolume:
5
Year:
2005
Language:
english
Pages:
4
Journal:
Current Applied Physics
DOI:
10.1016/j.cap.2005.01.029
File:
PDF, 357 KB
english, 2005