Investigation of complex channel capacitance in C60 field...

Current Applied Physics 2007 Vol. 7; Iss. 1

Investigation of complex channel capacitance in C60 field effect transistor and evaluation of the effect of grain boundaries

Tetsuhiko Miyadera, Manabu Nakayama, Susumu Ikeda, Koichiro Saiki
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Volume:
7
Year:
2007
Language:
english
Pages:
5
Journal:
Current Applied Physics
DOI:
10.1016/j.cap.2006.01.054
File:
PDF, 332 KB
english, 2007
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