Quantification from highly drifted and overlapped...

Quantification from highly drifted and overlapped chromatographic peaks using second-order calibration methods

Enric Comas, R.Ana Gimeno, Joan Ferré, Rosa M. Marcé, Francesc Borrull, F.Xavier Rius
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Volume:
1035
Year:
2004
Language:
english
Pages:
8
DOI:
10.1016/j.chroma.2004.02.069
File:
PDF, 156 KB
english, 2004
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