An effective defect inspection system for polarized film images using image segmentation and template matching techniques
Young-Geun Yoon, Seok-Lyong Lee, Chin-Wan Chung, Sang-Hee KimVolume:
55
Year:
2008
Language:
english
Pages:
17
DOI:
10.1016/j.cie.2008.01.015
File:
PDF, 1.68 MB
english, 2008